Secure and Dependable Patterns in Organizations: An Empirical Approach.

Publication Type  Conference Paper
Year of Publication  2007
Authors  Asnar, Y.; Bonato, R.; Giorgini, P.; Massacci, F.; Meduri, V.; Riccucci, C.; Saydane, A.
Conference Name  15th IEEE International Requirements Engineering Conference (RE '07)
Conference Start Date  15/10/2007
Conference Location  New Delhi, India
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ASNA-ETAL-07-RE.pdf145.02 KB

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